Tungsten Contact Probes
The precision tungsten probe is made of high-quality pure tungsten as raw material and processed through intensive technology. It has the characteristics of high precision, high strength, good wear resistance and corrosion resistance, relatively good elastic modulus, high smoothness, and long service life.
The tip of the tungsten contact probe is controlled at a minimum of 60 microns, and it is mainly used in the semiconductor industry, that is, for probe cards, probe stations, etc. to realize wafer testing and chip testing.
Tungsten needles for semiconductor test probes
Tungsten contact probes are mainly used in the final testing stage of semiconductors to connect the chip and the test board. It is a very important factor affecting contact and electrical characteristics. In layman's terms, the purpose of contact probe is to identify good and bad products.
Tungsten needles are usually mounted on probe cards or probe stations. It is made to have a fine tip shape. This is so that it does not cause damage to the chip electrode itself when it comes into contact with the chip.
If there is any interest in tungsten products, please feel free to contact us through the following methods.
Email: sales@chinatungsten.com
Tel.: +86 592 512 9696/+86 592 512 9595/+86 592 512 7878
Fax:+86 592 512 9797
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